Jhih-Wei You
According to our database1,
Jhih-Wei You
authored at least 2 papers
between 2010 and 2013.
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Bibliography
2013
In-Situ Method for TSV Delay Testing and Characterization Using Input Sensitivity Analysis.
IEEE Trans. Very Large Scale Integr. Syst., 2013
2010
Proceedings of the 19th IEEE Asian Test Symposium, 2010