Jerry M. Soden

According to our database, Jerry M. Soden authored at least 26 papers between 1985 and 2002.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2002

Parametric Failures in CMOS ICs - A Defect-Based Analysis.

Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs.

Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments.

Ivan de Paúl, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

1999

Test and Reliability: Partners in IC Manufacturing, Part 2.

Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin

IEEE Des. Test Comput., 1999

Deep Submicron CMOS Current IC Testing: Is There a Future?

Charles F. Hawkins, Jerry M. Soden

IEEE Des. Test Comput., 1999

1998

CMOS IC reliability indicators and burn-in economics.

Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

Still in the Stone Age?

Jerry M. Soden, Christopher L. Henderson

IEEE Des. Test Comput., 1997

IC Failure Analysis: Magic, Mystery, and Science.

Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson

IEEE Des. Test Comput., 1997

IC Diagnosis: Industry Issues.

Jerry M. Soden, Christopher L. Henderson

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Signature Analysis for IC Diagnosis and Failure Analysis.

Christopher L. Henderson, Jerry M. Soden

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Transient Power Supply Voltage (V_DDT) Analysis for Detecting IC Defects.

Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

IDDQ Testing: Issues Present and Future.

Jerry M. Soden, Charles F. Hawkins

IEEE Des. Test Comput., 1996

IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science.

Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

High Resolution I_DDQ Characterization and Testing - Practical Issues.

Alan W. Righter, Jerry M. Soden, Richard W. Beegle

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

IDDQ Design and Test Advantages Propel Industry.

Charles F. Hawkins, Jerry M. Soden

IEEE Des. Test Comput., 1995

1994

Defect Classes - An Overdue Paradigm for CMOS IC.

Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

IC failure analysis: techniques and tools for quality reliability improvement.

Jerry M. Soden, Richard E. Anderson

Proc. IEEE, 1993

Quality Testing Requires Quality Thinking.

Jerry M. Soden, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

IDDQ testing: A review.

Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao

J. Electron. Test., 1992

1991

The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits.

Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

Zero defects or zero stuck-at faults-CMOS IC process improvement with I_DDQ.

Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

Increased CMOS IC stuck-at fault coverage with reduced I _DDQ test sets.

Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1989

CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations.

Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins

Proceedings of the Proceedings International Test Conference 1989, 1989

1986

Test Considerations for Gate Oxide Shorts in CMOS ICs.

Jerry M. Soden, Charles F. Hawkins

IEEE Des. Test, 1986

Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs.

Jerry M. Soden, Charles F. Hawkins

Proceedings of the Proceedings International Test Conference 1986, 1986

1985

Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs.

Jerry M. Soden, Charles F. Hawkins

Proceedings of the Proceedings International Test Conference 1985, 1985