Jeonghoon Oh

According to our database, Jeonghoon Oh authored at least 13 papers between 2010 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Cell to Core-Periphery Overlap (C2O) Based on BCAT for Next Generation DRAM.

Kiseok Lee, Hongjun Lee, Hyungeun Choi, Jeongsu Kim, Kyunghwan Kim, Moonyoung Jeong, Soohyun Bae, Hyebin Kim, Jiyun Lee, Minsoo Kim, Keunnam Kim, Huijung Kim, Sungmin Park, Taejin Park, Jin-Woo Han, Jeonghoon Oh, Yong Kwan Kim, Sungsoo Yim, Bongsoo Kim, Jemin Park, Jaihyuk Song

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

A Metal Dual Work-Function Gate (MDWG) for the Continuous Scaling of DRAM Cell Transistors.

Junsoo Kim, Hyun Jung Lee, Sung Ho Jang, Jun Bum Lee, Ilgweon Kim, Jeonghoon Oh, Jemin Park, Jaihyuk Song

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

Effect of Back Gate on Word Line Disturb Immunity of a Vertical Channel DRAM Cell Array Transistor.

Moonyoung Jeong, Sangho Lee, Yootak Jun, Kiseok Lee, Seokhan Park, Jeonghoon Oh, Ilgweon Kim, Jemin Park

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

14nm DRAM Development and Manufacturing.

Kanguk Kim, Youngwoo Son, Hoin Ryu, Byunghyun Lee, Jooncheol Kim, Hyunsu Shin, Joonyoung Kang, Jihun Kim, Shinwoo Jeong, Kyosuk Chae, Dongkak Lee, Ilwoo Jung, Yongkwan Kim, Boyoung Song, Jeonghoon Oh, Jungwoo Song, Seguen Park, Keumjoo Lee, Hyodong Ban, Jiyoung Kim, Jooyoung Lee

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

Investigation on NBTI Control Techniques of HKMG Transistors for Low-power DRAM applications.

Wonju Sung, Hyun Seung Kim, Jung Hoon Han, Seguen Park, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Analysis of Intermittent Single-bit Failure on 10-nm node generation DRAM Devices.

Hyewon Seo, Taiuk Rim, Eunsun Lee, Sekyoung Jang, Kyosuk Chae, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Enhanced DRAM Single Bit Characteristics from Process Control of Chlorine.

Taiuk Rim, Kyosuk Che, Sehyun Kwon, Jin-Seong Lee, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Investigation of Sub-20nm 4th generation DRAM cell transistor's parasitic resistance and scalable methodology for Sub-20nm era.

Shinwoo Jeong, Jin-Seong Lee, Jiuk Jang, Jooncheol Kim, Hyunsu Shin, Jihun Kim, Jeongwoo Song, Dongsoo Woo, Jeonghoon Oh, Jooyoung Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Measuring Torque Production with a Robotic Exoskeleton during Cervical Transcutaneous Spinal Stimulation.

Erin Mahan, Nathan Dunkelberger, Jeonghoon Oh, Madison Simmons, Blesson Varghese, Dimitry Sayenko, Marcia K. O'Malley

Proceedings of the International Conference on Rehabilitation Robotics, 2022

2018

Validation of Static and Dynamic Balance Assessment Using Microsoft Kinect for Young and Elderly Populations.

Moataz Eltoukhy, Christopher Kuenze, Jeonghoon Oh, Joseph F. Signorile

IEEE J. Biomed. Health Informatics, 2018

A sub-0.85V, 6.4GBP/S/Pin TX-Interleaved Transceiver with Fast Wake-Up Time Using 2-Step Charging Control and VOHCalibration in 20NM DRAM Process.

Jin-Hyeok Baek, Chang-Kyo Lee, Kiho Kim, Daesik Moon, Gil-Hoon Cha, Jin-Seok Heo, Min-Su Ahn, Dong-Ju Kim, Jae-Joon Song, Seokhong Kwon, Jongmin Kim, Kyung-Soo Kim, Jinoh Ahn, Jeong-Sik Nam, Byung-Cheol Kim, Jeong-Hyeon Cho, Jeonghoon Oh, Seung-Jun Bae, Indal Song, Seok-Hun Hyun, Ilgweon Kim, Hyuck-Joon Kwon, Young-Soo Sohn, Jung-Hwan Choi, Kwang-Il Park, Seong-Jin Jang

Proceedings of the 2018 IEEE Symposium on VLSI Circuits, 2018

2016

Off-state degradation with ac bias in PMOSFET.

Segeun Park, Hyuckchai Jung, Jeonghoon Oh, Ilgweon Kim, Hyoungsun Hong, Gyoyoung Jin, Yonghan Roh

Microelectron. Reliab., 2016

2010

Development of Wireless RFID Glove for Various Applications.

Chang Won Lee, Min Chul Kim, Jinwoo Park, Jeonghoon Oh, Kihwan Eom

Proceedings of the Security-Enriched Urban Computing and Smart Grid, 2010