Jenny Leung

According to our database, Jenny Leung authored at least 10 papers between 2007 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of two.

2022

Workload Evaluations for Closed Captioners.

Maria Karam, Christie Christelis, Evan Hibbard, Jenny Leung, Tatyana Kumarasamy, Margot Whitfield, Deborah I. Fels

Proceedings of the Computers Helping People with Special Needs, 2022

2012

Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO.

Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren

Proceedings of the Sensors, 2012

2011

Tradeoffs in imager design parameters for sensor reliability.

Glenn H. Chapman, Jenny Leung, Rahul Thomas, Zahava Koren, Israel Koren

Proceedings of the Sensors, 2011

Predicting Pixel Defect Rates Based on Image Sensor Parameters.

Glenn H. Chapman, Jenny Leung, Ana I. L. Namburete, Israel Koren, Zahava Koren

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

2010

Tradeoffs in Imager Design with Respect to Pixel Defect Rates.

Glenn H. Chapman, Jenny Leung, Israel Koren, Zahava Koren

Proceedings of the 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010

2009

Statistical identification and analysis of defect development in digital imagers.

Jenny Leung, Glenn H. Chapman, Zahava Koren, Israel Koren

Proceedings of the Digital Photography V, 2009

Characterization of Gain Enhanced In-Field Defects in Digital Imagers.

Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009

2008

Automatic Detection of In-field eld Defect Growth in Image Sensors.

Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008

2007

Quantitative Analysis of In-Field Defects in Image Sensor Arrays.

Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects.

Jozsef Dudas, Michelle L. La Haye, Jenny Leung, Glenn H. Chapman

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007