Jennifer Kitchen

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

2022

A 650 kV/μs Common-Mode Resilient CMOS Galvanically Isolated Communication System.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. I Regul. Pap., 2022

Application Driven Rapid Synthesis for Analog BIST Components.

[BibT_eX]

[DOI]

Sangjukta R. Chowdhury

Sumit Bhardwaj

Proceedings of the 65th IEEE International Midwest Symposium on Circuits and Systems, 2022

Design Automation of CMOS Op-Amps Using Statistical Geometric Programming.

[BibT_eX]

[DOI]

Sangjukta R. Chowdhury

Sumit Bhardwaj

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

2020

In-Field Recovery of RF Circuits from Wearout Based Performance Degradation.

[BibT_eX]

[DOI]

IEEE Trans. Emerg. Top. Comput., 2020

Adaptive Power Control Using Current Adjustment for Watt-Level Power Amplifiers in CMOS SOI.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2020

A Dividerless Ring Oscillator PLL With 250fs Integrated Jitter Using Sampled Lowpass Filter.

[BibT_eX]

[DOI]

Kevin Grout

IEEE Trans. Circuits Syst., 2020

Self-Interference Signal Path Characterization in Full-Duplex Transceivers Using Built-in Self-Test.

[BibT_eX]

[DOI]

Debatrayee Roychowdhury

Soroush Moallemi

Proceedings of the 2020 IEEE Radio and Wireless Symposium, 2020

Preservation of Phase Resolution with Wideband Integer-N Based Phase Modulators.

[BibT_eX]

[DOI]

Kevin Grout

Proceedings of the 2020 IEEE Radio and Wireless Symposium, 2020

2019

On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration.

[BibT_eX]

[DOI]

IEEE Des. Test, 2019

Innovative Design for Test in State-of-the-Art Analog Systems.

[BibT_eX]

[DOI]

Hans Martin von Staudt

Amit Majumdar

Bill Taylor

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

CMOS Power Drivers for Digital Transmitters: Challenges and Architectures.

[BibT_eX]

[DOI]

Soroush Moallemi

Kevin Grout

Proceedings of the IEEE Radio and Wireless Symposium, 2019

A Multilevel Pulse-Width Modulated Class-E Power Amplifier.

[BibT_eX]

[DOI]

Mahdi Javid

Proceedings of the IEEE Radio and Wireless Symposium, 2019

2018

A built-in self-test technique for transmitter-only systems.

[BibT_eX]

[DOI]

Maryam Shafiee

Jennifer N. Kitchen

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

RF circuit authentication for detection of process Trojans.

[BibT_eX]

[DOI]

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

2017

A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources.

[BibT_eX]

[DOI]

ACM Trans. Design Autom. Electr. Syst., 2017

2016

Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2016

Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2016

Process independent gain measurement with low overhead via BIST/DUT co-design.

[BibT_eX]

[DOI]

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Post fabrication tuning of GaN based RF power amplifiers for pico-cell applications.

[BibT_eX]

[DOI]

Muhammad Ruhul Hasin

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Post-production adaptation of RF circuits for application-specific performance metrics.

[BibT_eX]

[DOI]

Doohwang Chang

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

2015

A self-compensating built-in self-test solution for RF phased array mismatch.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Test Conference, 2015

Robust amplitude measurement for RF BIST applications.

[BibT_eX]

[DOI]