Jeffrey W. Teng
Orcid: 0000-0003-1578-3426
According to our database1,
Jeffrey W. Teng
authored at least 10 papers
between 2019 and 2024.
Collaborative distances:
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Bibliography
2024
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2023
The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2023
2022
Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers.
Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022
Performance vs. Reliability Tradeoffs of Medium Breakdown and High Performance Cascode Amplifier Cells.
Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022
2021
Analysis of the Impact of Radiation-Induced Optical Transients on Deep-Space Optical Communications Systems using PPM.
Proceedings of the Optical Fiber Communications Conference and Exhibition, 2021
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021
2020
Compact Modeling of SiGe HBTs for Design of Cryogenic Control and Readout Circuits for Quantum Computing.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2020
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2020
2019
Proceedings of the 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2019