Jeffery Lam

According to our database, Jeffery Lam authored at least 2 papers in 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis.

Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Hui Peng Ng, Alfred C. T. Quah, Angela Teo, Jeffery Lam, Zhihong Mai

Microelectron. Reliab., 2017

Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern.

Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Soh Ping Neo, Dayanand Nagalingam, Kim Hong Yip, Jeffery Lam, Zhihong Mai

Microelectron. Reliab., 2017