Jeff Rearick
According to our database1,
Jeff Rearick
authored at least 45 papers
between 1993 and 2023.
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Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2023
Proceedings of the IEEE International Test Conference, 2023
2022
Proceedings of the IEEE International Test Conference, 2022
2021
Proceedings of the 26th IEEE European Test Symposium, 2021
2020
Proceedings of the IEEE International Test Conference, 2020
Proceedings of the IEEE International Test Conference, 2020
Proceedings of the IEEE European Test Symposium, 2020
2019
Proceedings of the 37th IEEE VLSI Test Symposium, 2019
2018
Proceedings of the 36th IEEE VLSI Test Symposium, 2018
2017
Proceedings of the IEEE International Test Conference, 2017
Proceedings of the IEEE International Test Conference, 2017
2016
Proceedings of the 29th IEEE International System-on-Chip Conference, 2016
2015
Proceedings of the 2015 IEEE International Test Conference, 2015
2014
Comparing the effectiveness of cache-resident tests against cycleaccurate deterministic functional patterns.
Proceedings of the 2014 International Test Conference, 2014
2013
Proceedings of the 18th IEEE European Test Symposium, 2013
2012
Proceedings of the 17th IEEE European Test Symposium, 2012
2011
Proceedings of the 29th IEEE VLSI Test Symposium, 2011
2010
Proceedings of the 28th IEEE VLSI Test Symposium, 2010
Proceedings of the 2011 IEEE International Test Conference, 2010
2009
IEEE Des. Test Comput., 2009
Proceedings of the 2009 IEEE International Test Conference, 2009
Proceedings of the 2009 IEEE International Test Conference, 2009
2008
Proceedings of the 2008 IEEE International Test Conference, 2008
2007
IEEE Des. Test Comput., 2007
Proceedings of the 2007 IEEE International Test Conference, 2007
Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007
2006
A Case Study of Using IEEE P1687 (IJTAG) for High-Speed Serial I/O Characterization and Testing.
Proceedings of the 2006 IEEE International Test Conference, 2006
Proceedings of the 2006 IEEE International Test Conference, 2006
Proceedings of the 2006 IEEE International Test Conference, 2006
2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
2004
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
2003
Test Data Compression and Test Time Reduction of Longest-Path-Per-Gate Tests based on Illinois Scan Architecture.
Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
2001
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001
2000
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000
1999
Proceedings of the Proceedings IEEE International Test Conference 1999, 1999
1998
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998
1997
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997
1993
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993