Jeevesh Kumar

According to our database1, Jeevesh Kumar authored at least 10 papers between 2020 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of five.

Timeline

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Bibliography

2024
Hot Carrier Dynamics and Electrical Breakdown Analysis in 2D Transition Metal Dichalcogenide FETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Decoupling Current and Voltage Mediated Breakdown Mechanisms in CVD MoS2 FETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Breakthrough Metal/Graphene Interface Phonon Engineering for Reliable Graphene Based-Heat Spreaders.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023
OFF State Reliability Challenges of Monolayer WS2 FET Photodetector: Impact on the Dark and Photo-Illuminated State.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

Unveiling Field Driven Performance Unreliabilities Governed by Channel Dynamics in MoSe2 FETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

Atomic-level Insight and Quantum Chemistry of Ambient Reliability Issues of the TMDs Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Are Argon and Nitrogen Gases Really Inert to Graphene Devices?
Proceedings of the Device Research Conference, 2022

2020
Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Defect Assisted Metal-TMDs Interface Engineering: A First Principle Insight.
Proceedings of the 2020 Device Research Conference, 2020


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