Jeevesh Kumar

According to our database, Jeevesh Kumar authored at least 10 papers between 2020 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2024

Hot Carrier Dynamics and Electrical Breakdown Analysis in 2D Transition Metal Dichalcogenide FETs.

Rupali Verma, Utpreksh Patbhaje, Asif Altaf Shah, Jeevesh Kumar, Rajarshi Roy Chaudhuri, Aadil Bashir Dar, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Decoupling Current and Voltage Mediated Breakdown Mechanisms in CVD MoS2 FETs.

Utpreksh Patbhaje, Rupali Verma, Jeevesh Kumar, Aadil Bashir Dar, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Breakthrough Metal/Graphene Interface Phonon Engineering for Reliable Graphene Based-Heat Spreaders.

Jeevesh Kumar, Aadil Bashir Dar, Asif A. Shah, K. M. Amogh, Sumana Chattaraj, Utpreksh Patbhaje, Anand Kumar Rai, Rupali Verma, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

OFF State Reliability Challenges of Monolayer WS2 FET Photodetector: Impact on the Dark and Photo-Illuminated State.

Rupali Verma, Utpreksh Patbhaje, Jeevesh Kumar, Anand Kumar Rai, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Unveiling Field Driven Performance Unreliabilities Governed by Channel Dynamics in MoSe2 FETs.

Utpreksh Patbhaje, Rupali Verma, Jeevesh Kumar, Ansh, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Atomic-level Insight and Quantum Chemistry of Ambient Reliability Issues of the TMDs Devices.

Jeevesh Kumar, Hemanjaneyulu Kuruva, Harsha B. Variar, Utpreksh Patbhaje, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Are Argon and Nitrogen Gases Really Inert to Graphene Devices?

Jeevesh Kumar, Mayank Shrivastava

Proceedings of the Device Research Conference, 2022

2020

Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress.

Jeevesh Kumar, Ansh, Asha Yadav, Anant Singh, Andrew Naclerio, Dmitri N. Zakharov, Piran Kidambi, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel.

Ansh, Gaurav Sheoran, Jeevesh Kumar, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Defect Assisted Metal-TMDs Interface Engineering: A First Principle Insight.

Jeevesh Kumar, Ansh, Hemanjaneyulu Kuruva, Mayank Shrivastava

Proceedings of the 2020 Device Research Conference, 2020