Jee-Youl Ryu
Orcid: 0000-0002-3787-6802
According to our database1,
Jee-Youl Ryu
authored at least 26 papers
between 2004 and 2024.
Collaborative distances:
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Bibliography
2024
The Intersection of Machine Learning and Wireless Sensor Network Security for Cyber-Attack Detection: A Detailed Analysis.
Sensors, October, 2024
IEEE Trans. Very Large Scale Integr. Syst., September, 2024
an-QNA: An Adaptive Nesterov Quasi-Newton Acceleration-Optimized CMOS LNA for 65 nm Automotive Radar Applications.
Sensors, September, 2024
A Reformed PSO-Based High Linear Optimized Up-Conversion Mixer for Radar Application.
Sensors, February, 2024
Analysis and investigation of a novel underwater channel model for OWC under log-normal turbulent condition.
Photonic Netw. Commun., February, 2024
A Design of Adaptive Genetic Algorithm-Based Optimized Power Amplifier for 5G Applications.
Circuits Syst. Signal Process., January, 2024
2023
Sensors, December, 2023
2022
A 65 nm Duplex Transconductance Path Up-Conversion Mixer for 24 GHz Automotive Short-Range Radar Sensor Applications.
Sensors, 2022
Pattern Classification Using Quantized Neural Networks for FPGA-Based Low-Power IoT Devices.
Sensors, 2022
A Novel 65 nm Active-Inductor-Based VCO with Improved Q-Factor for 24 GHz Automotive Radar Applications.
Sensors, 2022
A novel dual mode configurable and tunable high-gain, high-efficient CMOS power amplifier for 5G applications.
Integr., 2022
2021
Sensors, 2021
Design and Analysis of a Novel 24 GHz Up-Conversion Mixer with Improved Derivative Super-Position Linearizer Technique for 5G Applications.
Sensors, 2021
2020
2018
Integr., 2018
2016
2015
Microelectron. J., 2015
2010
Proceedings of the Communication and Networking, 2010
Proceedings of the Communication and Networking, 2010
2008
Displays, 2008
2006
IEEE Trans. Instrum. Meas., 2006
2005
Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers.
Microelectron. J., 2005
J. Electron. Test., 2005
2004
Proceedings of the Proceedings 2004 IEEE International SOC Conference, 2004
Proceedings of the 9th European Test Symposium, 2004