Jeanne Bickford

According to our database, Jeanne Bickford authored at least 3 papers between 2006 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test.

Jeanne Bickford, Nazmul Habib, John Goss, Robert McMahon, Rajiv V. Joshi, Rouwaida Kanj

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

2006

Yield Improvement by Local Wiring Redundancy.

Jeanne Bickford, Jason Hibbeler, Markus Bühler, Jürgen Koehl, Dirk Müller, Sven Peyer, Christian Schulte

Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design.

Markus Bühler, Jürgen Koehl, Jeanne Bickford, Jason Hibbeler, Ulf Schlichtmann, Ralf Sommer, Michael Pronath, Andreas Ripp

Proceedings of the Conference on Design, Automation and Test in Europe, 2006