Jean-Marc Daveau
According to our database1,
Jean-Marc Daveau
authored at least 33 papers
between 1995 and 2024.
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Bibliography
2024
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach.
J. Electron. Test., June, 2024
Drift of Combinational Circuits Failure Rates with a Probabilistic Model Approximated by Partitioning.
Proceedings of the 37th SBC/SBMicro/IEEE Symposium on Integrated Circuits and Systems Design, 2024
Proceedings of the 22nd ACM-IEEE International Symposium on Formal Methods and Models for System Design, 2024
Proceedings of the IEEE European Test Symposium, 2024
2023
Fast analysis of combinatorial netlists correctness rate based on binomial law and partitioning.
Proceedings of the 24th IEEE Latin American Test Symposium, 2023
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2023
2022
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022
2021
Automated Dysfunctional Model Extraction for Model Based Safety Assessment of Digital Systems.
Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021
Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021
2018
A 2.7 pJ/cycle 16 MHz, 0.7 µW Deep Sleep Power ARM Cortex-M0+ Core SoC in 28 nm FD-SOI.
IEEE J. Solid State Circuits, 2018
2017
Proceedings of the 43rd IEEE European Solid State Circuits Conference, 2017
2016
30% static power improvement on ARM Cortex<sup>®</sup>-A53 using static biasing-anticipation.
Proceedings of the ESSCIRC Conference 2016: 42<sup>nd</sup> European Solid-State Circuits Conference, 2016
2015
Proceedings of the IEEE 6th Latin American Symposium on Circuits & Systems, 2015
8.4 A 0.33V/-40°C process/temperature closed-loop compensation SoC embedding all-digital clock multiplier and DC-DC converter exploiting FDSOI 28nm back-gate biasing.
Proceedings of the 2015 IEEE International Solid-State Circuits Conference, 2015
Design and performance parameters of an ultra-low voltage, single supply 32bit processor implemented in 28nm FDSOI technology.
Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015
Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation test.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
28nm FD-SOI technology and design platform for sub-10pJ/cycle and SER-immune 32bits processors.
Proceedings of the ESSCIRC Conference 2015, 2015
2011
An approach to reduce computational cost in combinatorial logic netlist reliability analysis using circuit clustering and conditional probabilities.
Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011
2010
Fast reliability analysis of combinatorial logic circuits using conditional probabilities.
Microelectron. Reliab., 2010
Handling reconvergent paths using conditional probabilities in combinatorial logic netlist reliability estimation.
Proceedings of the 17th IEEE International Conference on Electronics, 2010
Verification of soft error detection mechanism through fault injection on hardware emulation platform.
Proceedings of the IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2010), Chicago, Illinois, USA, June 28, 2010
2008
Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS.
Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008
2004
Proceedings of the 2004 ACM SIGPLAN/SIGBED Conference on Languages, 2004
2002
Proceedings of the Embedded Software, Second International Conference, 2002
2001
2000
Des. Autom. Embed. Syst., 2000
1999
Proceedings of the Tenth IEEE International Workshop on Rapid System Prototyping (RSP 1999), 1999
1998
Integr. Comput. Aided Eng., 1998
Proceedings of the Sixth International Workshop on Hardware/Software Codesign, 1998
1997
IEEE Trans. Very Large Scale Integr. Syst., 1997
Proceedings of the 1997 IEEE/ACM International Conference on Computer-Aided Design, 1997
1996
Microprocess. Microsystems, 1996
1995
Proceedings of the 8th International Symposium on System Synthesis (ISSS 1995), 1995