Jean Manca

According to our database, Jean Manca authored at least 5 papers between 2001 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2004

Evidence for source side injection hot carrier effects on lateral DMOS transistors.

Stefano Aresu, Ward De Ceuninck, Geert Van den Bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot

Microelectron. Reliab., 2004

2003

A new method for the analysis of high-resolution SILC data.

Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen

Microelectron. Reliab., 2003

2002

High-resolution SILC measurements of thin SiO₂ at ultra low voltages.

Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger

Microelectron. Reliab., 2002

2001

A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation.

R. Dreesen, Kris Croes, Jean Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken

Microelectron. Reliab., 2001

High-resolution in-situ of gold electromigration: test time reduction.

Kris Croes, R. Dreesen, Jean Manca, Ward De Ceuninck, Luc De Schepper, Luc Tielemans, P. J. van der Wel

Microelectron. Reliab., 2001