Jean Coignus
Orcid: 0000-0001-8898-5999
According to our database1,
Jean Coignus
authored at least 15 papers
between 2015 and 2024.
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Bibliography
2024
Polarization-Dependent Oxygen, Vacancy Distribution in Ferroelectric Hf0.5 Zr0.5 O2 Capacitors.
Proceedings of the 22nd Non-Volatile Memory Technology Symposium, 2024
Data Retention Insights from Joint Analysis on BEOL-Integrated HZO-Based Scaled FeCAPs and 16kbit 1T-1C FeRAM Arrays.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Charge-based Sense Demonstration in 1T-1C HZO FeRAM Arrays to Overcome CBL-induced Bank Size Limitations.
Proceedings of the IEEE International Memory Workshop, 2024
2023
Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited).
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Memory Window in Si: HfO2 FeRAM arrays: Performance Improvement and Extrapolation at Advanced Nodes.
Proceedings of the IEEE International Memory Workshop, 2023
2022
Interplay between charge trapping and polarization switching in MFDM stacks evidenced by frequency-dependent measurements.
Proceedings of the 48th IEEE European Solid State Circuits Conference, 2022
2021
Proceedings of the IEEE International Symposium on Circuits and Systems, 2021
Study on the difference between ID(VG) and C(VG) pBTI shifts in GaN-on-Si E-mode MOSc-HEMT.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study.
Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021
Polarization switching and interface charges in BEOL compatible Ferroelectric Tunnel Junctions.
Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021
2017
Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology.
Microelectron. Reliab., 2017
Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40 nm floating gate embedded-flash memory.
Microelectron. Reliab., 2017
Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017
Precise EOT regrowth extraction enabling performance analysis of low temperature extension first devices.
Proceedings of the 47th European Solid-State Device Research Conference, 2017
2015
Microelectron. Reliab., 2015