Jayashree Saxena

According to our database, Jayashree Saxena authored at least 18 papers between 1992 and 2009.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2009

Multidimensional Test Escape Rate Modeling.

Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch

IEEE Des. Test Comput., 2009

2008

Low Power Test for Nanometer System-on-Chips (SoCs).

Srivaths Ravi, Rubin A. Parekhji, Jayashree Saxena

J. Low Power Electron., 2008

Modeling Test Escape Rate as a Function of Multiple Coverages.

Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena

Proceedings of the 2008 IEEE International Test Conference, 2008

2004

Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques.

Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

A Case Study of IR-Drop in Structured At-Speed Testing.

Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges .

Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

An analysis of power reduction techniques in scan testing.

Jayashree Saxena, Kenneth M. Butler, Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Computer-aided fault to defect mapping (CAFDM) for defect diagnosis.

Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

An empirical study on the effects of test type ordering on overall test efficiency.

Jayashree Saxena, Kenneth M. Butler

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1998

On applying non-classical defect models to automated diagnosis.

Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

IC diagnosis: preventing wars and war stories.

Jayashree Saxena

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

Automated Diagnosis in Testing and Failure Analysis.

Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena

IEEE Des. Test Comput., 1997

Bridging Fault Diagnosis in the Absence of Physical Information.

David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

Integrating Automated Diagnosis into the Testing and Failure Analysis Operations.

Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

A novel scheme to reduce test application time in circuits with full scan.

Dhiraj K. Pradhan, Jayashree Saxena

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

1993

A Method to Derive Compact Test Sets for Path Delay Faults in Combinational Circuits.

Jayashree Saxena, Dhiraj K. Pradhan

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Desgin for Testability of Asynchronous Sequential Circuits.

Jayashree Saxena, Dhiraj K. Pradhan

Proceedings of the Proceedings 1993 International Conference on Computer Design: VLSI in Computers & Processors, 1993

1992

A design for testability scheme to reduce test application time in full scan.

Dhiraj K. Pradhan, Jayashree Saxena

Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992