Jane Y. N. Tan

According to our database, Jane Y. N. Tan authored at least 1 paper in 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

Drop impact reliability testing for lead-free and lead-based soldered IC packages.

Desmond Y. R. Chong, F. X. Che, John H. L. Pang, Kellin Ng, Jane Y. N. Tan, Patrick T. H. Low

Microelectron. Reliab., 2006