Janakiraman Viraraghavan
Orcid: 0000-0003-4899-0368
According to our database1,
Janakiraman Viraraghavan
authored at least 14 papers
between 2008 and 2024.
Collaborative distances:
Collaborative distances:
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Bibliography
2024
Input-Conditioned Quantisation for ENOB Improvement in CIM ADC Columns Targeting Large-Length Partial Sums.
IEEE Trans. Circuits Syst. II Express Briefs, June, 2024
2023
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., June, 2023
Layout-Based Digital IC Course Projects in Large Classes: Implementation, Evaluation, and Plagiarism Detection.
IEEE Trans. Educ., February, 2023
2021
An Area-Efficient Word-Line Pitch-Aligned 8T SRAM Compatible Digital-to-Analog Converter.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2021
2020
IET Circuits Devices Syst., 2020
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020
2018
80-kb Logic Embedded High-K Charge Trap Transistor-Based Multi-Time-Programmable Memory With No Added Process Complexity.
IEEE J. Solid State Circuits, 2018
2016
IEEE J. Solid State Circuits, 2016
80Kb 10ns read cycle logic Embedded High-K charge trap Multi-Time-Programmable Memory scalable to 14nm FIN with no added process complexity.
Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016
2012
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012
2010
Voltage and Temperature Aware Statistical Leakage Analysis Framework Using Artificial Neural Networks.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010
2008
Voltage and Temperature Scalable Logic Cell Leakage Models Considering Local Variations Based on Transistor Stacks.
J. Low Power Electron., 2008
Voltage and Temperature Scalable Standard Cell Leakage Models Based on Stacks for Statistical Leakage Characterization.
Proceedings of the 21st International Conference on VLSI Design (VLSI Design 2008), 2008
Voltage and Temperature Scalable Gate Delay and Slew Models Including Intra-Gate Variations.
Proceedings of the 21st International Conference on VLSI Design (VLSI Design 2008), 2008