Jan Hoentschel
According to our database1,
Jan Hoentschel
authored at least 7 papers
between 2009 and 2022.
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Bibliography
2022
Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021
2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Proceedings of the 49th European Solid-State Device Research Conference, 2019
2018
Proceedings of the 48th European Solid-State Device Research Conference, 2018
2009
Advanced SOI CMOS transistor technologies for high-performance microprocessor applications.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2009