Jan D'Haen

According to our database, Jan D'Haen authored at least 6 papers between 2002 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modules.

Philippe Nivelle, Tom Borgers, Eszter Voroshazi, Jef Poortmans, Jan D'Haen, Ward De Ceuninck, Michael Daenen

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2005

A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure.

Kris Vanstreels, Marc D'Olieslaeger, Ward De Ceuninck, Jan D'Haen, Karen Maex

Microelectron. Reliab., 2005

2004

MTF test system with AC based dynamic joule correction for electromigration tests on interconnects.

Leen Biesemans, K. Schepers, Kris Vanstreels, Jan D'Haen, Ward De Ceuninck, Marc D'Olieslaeger

Microelectron. Reliab., 2004

2003

A new method for the analysis of high-resolution SILC data.

Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen

Microelectron. Reliab., 2003

2002

Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology.

R. Petersen, Ward De Ceuninck, Jan D'Haen, Marc D'Olieslaeger, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons

Microelectron. Reliab., 2002

Statistical aspects of the degradation of LDD nMOSFETs.

E. Andries, R. Dreesen, Kris Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen

Microelectron. Reliab., 2002