Jan Burchard

According to our database, Jan Burchard authored at least 15 papers between 2015 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

High-Bandwidth IJTAG over SSN.

Jonathan Gaudet, Jan Burchard, Matthias Kampmann, Jean-François Côté, Tim Callahan, Hung Ho Chai, Ivy Ee Hsia Lim, Lori Schramm, Olga Przybysz, Marta Stepniewska, Sascha Ochsenknecht, Michal Olejarz, Martin Keim

Proceedings of the IEEE International Test Conference, 2024

2019

On Secure Data Flow in Reconfigurable Scan Networks.

Pascal Raiola, Benjamin Thiemann, Jan Burchard, Ahmed Atteya, Natalia Lylina, Hans-Joachim Wunderlich, Bernd Becker, Matthias Sauer

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2018

Applying advanced SAT-based techniques to circuit testing.

Jan Burchard

PhD thesis, 2018

On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits.

Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Efficient generation of parametric test conditions for AMS chips with an interval constraint solver.

Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker, Matthias Sauer

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Characterization of possibly detected faults by accurately computing their detection probability.

Jan Burchard, Dominik Erb, Bernd Becker

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2017

Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG.

Pascal Raiola, Jan Burchard, Felix Neubauer, Dominik Erb, Bernd Becker

J. Electron. Test., 2017

Efficient SAT-based generation of hazard-activated TSOF tests.

Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Integrating Algebraic and SAT Solvers.

Jan Horácek, Jan Burchard, Bernd Becker, Martin Kreuzer

Proceedings of the Mathematical Aspects of Computer and Information Sciences, 2017

Evaluating the effectiveness of D-chains in SAT-based ATPG.

Jan Burchard, Felix Neubauer, Pascal Raiola, Dominik Erb, Bernd Becker

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

Towards mixed structural-functional models for algebraic fault attacks on ciphers.

Jan Burchard, Ange-Salomé Messeng Ekossono, Jan Horácek, Mael Gay, Bernd Becker, Tobias Schubert, Martin Kreuzer, Ilia Polian

Proceedings of the IEEE 2nd International Verification and Security Workshop, 2017

AutoFault: Towards Automatic Construction of Algebraic Fault Attacks.

Jan Burchard, Mael Gay, Ange-Salomé Messeng Ekossono, Jan Horácek, Bernd Becker, Tobias Schubert, Martin Kreuzer, Ilia Polian

Proceedings of the 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2017

Fast and waveform-accurate hazard-aware SAT-based TSOF ATPG.

Jan Burchard, Dominik Erb, Adit D. Singh, Sudhakar M. Reddy, Bernd Becker

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

Distributed Parallel #SAT Solving.

Jan Burchard, Tobias Schubert, Bernd Becker

Proceedings of the 2016 IEEE International Conference on Cluster Computing, 2016

2015

Laissez-Faire Caching for Parallel #SAT Solving.

Jan Burchard, Tobias Schubert, Bernd Becker

Proceedings of the Theory and Applications of Satisfiability Testing - SAT 2015, 2015