Jan Arild Tofte

According to our database, Jan Arild Tofte authored at least 3 papers between 2000 and 2004.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2004

Realizing High Test Quality Goals with Smart Test Resource Usage.

Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2001

An effort-minimized logic BIST implementation method.

Xinli Gu, Sung Soo Chung, Frank Tsang, Jan Arild Tofte, Hamid Rahmanian

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-in-Self-Test.

Jan Arild Tofte, Chee-Kian Ong, Jiun-Lang Huang, Kwang-Ting (Tim) Cheng

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000