Jamil Kawa

According to our database, Jamil Kawa authored at least 27 papers between 2001 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Test Modules for Enhanced Testability of Single Flux Quantum Integrated Circuits.

Abdelrahman G. Qoutb, Jamil Kawa, Eby G. Friedman

J. Electron. Test., October, 2024

A 5T Half-SRAM Design for Cold CMOS Physical Unclonable Function Applications and Beyond.

Rouwaida Kanj, Jamil Kawa

Proceedings of the 25th International Symposium on Quality Electronic Design, 2024

2022

Majority-based Design Flow for AQFP Superconducting Family.

Giulia Meuli, Vinicius N. Possani, Rajinder Singh, Siang-Yun Lee, Alessandro Tempia Calvino, Dewmini Sudara Marakkalage, Patrick Vuillod, Luca G. Amarù, Scott Chase, Jamil Kawa, Giovanni De Micheli

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2017

A 0.42V high bandwidth synthesizable parallel access smart memory fabric for computer vision.

Prashant Dubey, Kritika Aditya, Ankur Srivastava, Amit Khanuja, Jamil Kawa, Thu Nguyen

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

2010

Crosstalk-Induced Delay, Noise, and Interconnect Planarization Implications of Fill Metal in Nanoscale Process Technology.

Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud

IEEE Trans. Very Large Scale Integr. Syst., 2010

Who solves the variability problem?

Nagaraj Ns, Juan C. Rey, Jamil Kawa, Robert C. Aitken, Christian Lütkemeyer, Vijay Pitchumani, Andrzej J. Strojwas, Steve Trimberger

Proceedings of the 47th Design Automation Conference, 2010

2008

Hotspot Based Yield Prediction with Consideration of Correlations.

Qing Su, Charles C. Chiang, Jamil Kawa

Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

Investigating the Impact of Fill Metal on Crosstalk-Induced Delay and Noise.

Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud

Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

Robust reconfigurable filter design using analytic variability quantification techniques.

Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud

Proceedings of the 2008 International Conference on Computer-Aided Design, 2008

Impact of dummy filling techniques on interconnect capacitance and planarization in nano-scale process technology.

Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud

Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, 2008

Automated design of tunable impedance matching networks for reconfigurable wireless applications.

Arthur Nieuwoudt, Jamil Kawa, Yehia Massoud

Proceedings of the 45th Design Automation Conference, 2008

An innovative Steiner tree based approach for polygon partitioning.

Yongqiang Lu, Qing Su, Jamil Kawa

Proceedings of the 13th Asia South Pacific Design Automation Conference, 2008

2007

Design for Manufacturability and Yield for Nano-Scale CMOS

Charles C. Chiang, Jamil Kawa

Series on Integrated Circuits and Systems, Springer, ISBN: 978-1-4020-5188-3, 2007

DFM issues for 65nm and beyond.

Jamil Kawa, Charles C. Chiang

Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, 2007

2006

Accurate modeling of substrate resistive coupling for floating substrates.

Qing Su, Jamil Kawa, Charles C. Chiang, Yehia Massoud

ACM Trans. Design Autom. Electr. Syst., 2006

DFM: swimming upstream.

Dan Page, Jamil Kawa, Charles C. Chiang

Proceedings of the 16th ACM Great Lakes Symposium on VLSI 2006, Philadelphia, PA, USA, April 30, 2006

An IC manufacturing yield model considering intra-die variations.

Jianfeng Luo, Subarna Sinha, Qing Su, Jamil Kawa, Charles C. Chiang

Proceedings of the 43rd Design Automation Conference, 2006

EDA Challenges in Nano-scale Technology.

Jamil Kawa, Charles C. Chiang, Raul Camposano

Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006

Three DFM Challenges: Random Defects, Thickness Variation, and Printability Variation.

Charles C. Chiang, Jamil Kawa

Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems 2006, 2006

2005

A Min-Variance Iterative Method for Fast Smart Dummy Feature Density Assignment in Chemical-Mechanical Polishing.

Xin Wang, Charles C. Chiang, Jamil Kawa, Qing Su

Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005

A layout dependent full-chip copper electroplating topography model.

Jianfeng Luo, Qing Su, Charles C. Chiang, Jamil Kawa

Proceedings of the 2005 International Conference on Computer-Aided Design, 2005

Custom circuits.

Jamil Kawa, Jackie Snyder

Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005

Foundries, EDA vendors, and designers: who shoulders the blame when a design doesn't work in the nano-scale and wireless era?

Jamil Kawa, Yuhua Cheng, Hiroshi Iwai, Richard Goering, Michael Campbell, Raul Camposano, Jon Fields, Patrick Lin, Steve Lloyd, Joseph Sawicki, Ed Wan

Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005

2004

Routing resources consumption on M-arch and X-arch.

Bo-Kyung Choi, Charles C. Chiang, Jamil Kawa, Majid Sarrafzadeh

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Design automation for mask programmable fabrics.

Narendra V. Shenoy, Jamil Kawa, Raul Camposano

Proceedings of the 41th Design Automation Conference, 2004

2002

Managing on-chip inductive effects.

Yehia Massoud, Steve S. Majors, Jamil Kawa, Tareq Bustami, Don MacMillen, Jacob K. White

IEEE Trans. Very Large Scale Integr. Syst., 2002

2001

Modeling and Analysis of Differential Signaling for Minimizing Inductive Cross-Talk.

Yehia Massoud, Jamil Kawa, Don MacMillen, Jacob White

Proceedings of the 38th Design Automation Conference, 2001