James Wingfield

According to our database, James Wingfield authored at least 8 papers between 2002 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Maximizing scan pin and bandwidth utilization with a scan routing fabric.

Yan Dong, Grady Giles, GuoLiang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood

Proceedings of the IEEE International Test Conference, 2017

2016

Toward more efficient scan data bandwidth utilization on modern SOCs.

Yan Dong, Grady Giles, GuoLiang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood

Proceedings of the 29th IEEE International System-on-Chip Conference, 2016

2009

Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor.

Kedarnath J. Balakrishnan, Grady Giles, James Wingfield

IEEE Des. Test Comput., 2009

2008

Test Access Mechanism for Multiple Identical Cores.

Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield

Proceedings of the 2008 IEEE International Test Conference, 2008

2004

A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects.

Jennifer Dworak, James Wingfield, M. Ray Mercer

Proceedings of the 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 2004

Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects.

Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer

Proceedings of the 2004 Design, 2004

2003

Function-Based Dynamic Compaction and its Impact on Test Set Sizes.

James Wingfield, Jennifer Dworak, M. Ray Mercer

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

2002

Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults.

Jennifer Dworak, James Wingfield, Brad Cobb, Sooryong Lee, Li-C. Wang, M. Ray Mercer

Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002