James Jacob

According to our database, James Jacob authored at least 22 papers between 1985 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Improving spatial transferability of ecological niche model of Hevea brasiliensis using pooled occurrences of introduced ranges in two biogeographic regions of India.

Debabrata Ray, Mukunda Dev Behera, James Jacob

Ecol. Informatics, 2016

2000

Line coverage of path delay faults.

Ananta K. Majhi, V. D. Agrawak, James Jacob, Lalit M. Patnaik

IEEE Trans. Very Large Scale Integr. Syst., 2000

1998

A Fast Two-level Logic Minimizer.

P. Srinivasa Rao, James Jacob

Proceedings of the 11th International Conference on VLSI Design (VLSI Design 1991), 1998

Optimizing Logic Design Using Boolean Transforms.

Pramit Chavda, James Jacob, Vishwani D. Agrawal

Proceedings of the 11th International Conference on VLSI Design (VLSI Design 1991), 1998

1997

Adder and Comparator Synthesis with Exclusive-OR Transform of Inputs.

James Jacob, P. Srinivas Sivakumar, Vishwani D. Agrawal

Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

1996

A Novel Path Delay Fault Simulator Using Binary Logic.

Ananta K. Majhi, James Jacob, Lalit M. Patnaik

VLSI Design, 1996

Functional test generation for synchronous sequential circuits.

Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996

On test coverage of path delay faults.

Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal

Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

Cubical CAMP for minimization of Boolean functions.

Nripendra N. Biswas, C. Srikanth, James Jacob

Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

Lossless Compression Of Images Using Logic Minimization.

Anil K. Chaudhay, Jacob Augustine, James Jacob

Proceedings of the Proceedings 1996 International Conference on Image Processing, 1996

1995

Switching theoretic approach to image compression.

Jacob Augustine, Wen Feng, Anamitra Makur, James Jacob

Signal Process., 1995

Functional test generation for non-scan sequential circuits.

Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal

Proceedings of the 8th International Conference on VLSI Design (VLSI Design 1995), 1995

An efficient automatic test generation system for path delay faults in combinational circuits.

Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal

Proceedings of the 8th International Conference on VLSI Design (VLSI Design 1995), 1995

Logic minimization based approach for compressing image data.

Jacob Augustine, Wen Feng, James Jacob

Proceedings of the 8th International Conference on VLSI Design (VLSI Design 1995), 1995

1994

An Improved Deductive Fault Simulator.

P. R. Suresh Kumar, James Jacob, Mandyam-Komar Srinivas, Vishwani D. Agrawal

Proceedings of the Seventh International Conference on VLSI Design, 1994

1993

Efficient Technique to Reduce Gate Evaluations and Speed Up Fault Simulation.

P. R. Suresh Kumar, Mandyam-Komar Srinivas, James Jacob

Proceedings of the Sixth International Conference on VLSI Design, 1993

1992

Multiple fault detection in two-level multi-output circuits.

James Jacob, Vishwani D. Agrawal

J. Electron. Test., 1992

An Efficient Rule Based Fault Simulator.

Oommen Tharakan, James Jacob, Mandyam-Komar Srinivas

Proceedings of the Fifth International Conference on VLSI Design, 1992

Functional Test Generation for Sequential Circuits.

James Jacob, Vishwani D. Agrawal

Proceedings of the Fifth International Conference on VLSI Design, 1992

Finite State Machine Testing Based on Growth and Dissappearance Faults.

Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal

Proceedings of the Digest of Papers: FTCS-22, 1992

1990

Further Comments on "Detection of Faults in Programmable Logic Arrays".

James Jacob, Nripendra N. Biswas

IEEE Trans. Computers, 1990

1985

: A Testable PLA Design with Minimal Hardware and Test Set.

James Jacob, Nripendra N. Biswas

Proceedings of the Proceedings International Test Conference 1985, 1985