Jais Abraham

According to our database, Jais Abraham authored at least 9 papers between 2000 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Revisiting Test Compression Configuration in Context of Multi-Core Testing Using Packetized Scan Network.

Subhadip Kundu, Jais Abraham

Proceedings of the 37th International Conference on VLSI Design and 23rd International Conference on Embedded Systems, 2024

2022

Low Capture Power At-Speed Test with Local Hot Spot Analysis to Reduce Over-Test.

Ankush Srivastava, Jais Abraham

Proceedings of the IEEE International Test Conference, 2022

2017

Adapting an industrial memory BIST solution for testing CAMs.

Jais Abraham, Uttam Garg, Glenn Colón-Bonet, Ramesh Sharma, Chennian Di, Benoit Nadeau-Dostie, Etienne Racine, Martin Keim

Proceedings of the International Test Conference in Asia, 2017

2016

Test Time Minimisation in Scan Compression Designs Using Dynamic Channel Allocation.

Jais Abraham, Shankar Umapathi, Sumitha Krishnamurthi

Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016

2008

Evaluation of Entropy Driven Compression Bounds on Industrial Designs.

Srinivasulu Alampally, Jais Abraham, Rubin A. Parekhji, Rohit Kapur, Thomas W. Williams

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Enhancements in Deterministic BIST Implementations for Improving Test of Complex SOCs.

Sandeep Jain, Jais Abraham, Srinivas Kumar Vooka, Sumant Kale, Amit Dutta, Rubin A. Parekhji

Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007

2006

Multi-Cycle Sensitizable Transition Delay Faults.

Jais Abraham, Uday Goel, Arun Kumar

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

2002

Challenges in the Design of a Scalable Data-Acquisition and Processing System-on-Silicon.

Karanth Shankaranarayana, Soujanna Sarkar, R. Venkatraman, Shyam S. Jagini, N. Venkatesh, Jagdish C. Rao, H. Udayakumar, M. Sambandam, K. P. Sheshadri, S. Talapatra, Parag Mhatre, Jais Abraham, Rubin A. Parekhji

Proceedings of the 7th Asia and South Pacific Design Automation Conference (ASP-DAC 2002), 2002

2000

A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx.

Jais Abraham, Narayan Prasad, Srinivasa Chakravarthy B. S., Ameet Bagwe, Rubin A. Parekhji

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000