Jaihyuk Song

According to our database, Jaihyuk Song authored at least 10 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Highly manufacturable Self-Aigned Direct Backside Contact (SA-DBC) and Backside Gate Contact (BGC) for 3-dimensional Stacked FET at 48nm gate pitch.

Jaehyun Park, Juhun Park, Kyuman Hwang, Jinchan Yun, Dahye Kim, Sungil Park, Jejune Park, Jinwook Yang, Jae Won Jeong, Chuljin Yun, Jinho Bae, Sam Park, Daihong Huh, Sanghyeon Kim, Seungeun Baek, Suk Yang, Inhae Zoh, Junghan Lee, Tae-sun Kim, Younsu Ha, Sun-Jung Lee, Sang Wuk Park, Bong Jin Kuh, Daewon Ha, Sangjin Hyun, Sujin Ahn, Jaihyuk Song

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

Cell to Core-Periphery Overlap (C2O) Based on BCAT for Next Generation DRAM.

Kiseok Lee, Hongjun Lee, Hyungeun Choi, Jeongsu Kim, Kyunghwan Kim, Moonyoung Jeong, Soohyun Bae, Hyebin Kim, Jiyun Lee, Minsoo Kim, Keunnam Kim, Huijung Kim, Sungmin Park, Taejin Park, Jin-Woo Han, Jeonghoon Oh, Yong Kwan Kim, Sungsoo Yim, Bongsoo Kim, Jemin Park, Jaihyuk Song

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

A Metal Dual Work-Function Gate (MDWG) for the Continuous Scaling of DRAM Cell Transistors.

Junsoo Kim, Hyun Jung Lee, Sung Ho Jang, Jun Bum Lee, Ilgweon Kim, Jeonghoon Oh, Jemin Park, Jaihyuk Song

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

Expanding Design Technology Co-Optimization Potentials with Back-Side Interconnect Innovation.

Byung-Sung Kim, Subin Choi, Jung Han Lee, Kwangmuk Lee, Jisoo Park, Jiwook Kwon, Saehan Park, Kwanyoung Chun, Harsono Simka, Aravindh Kumar, Muhammed Ahosan Ul Karim, Ken Rim, Jaihyuk Song

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

6.10 A 1/1.56-inch 50Mpixel CMOS Image Sensor with 0.5μm pitch Quad Photodiode Separated by Front Deep Trench Isolation.

DongHyun Kim, Kwansik Cho, Ho-Chul Ji, Minkyung Kim, Junghye Kim, Taehoon Kim, Seungju Seo, Dongmo Im, You-Na Lee, Jinyong Choi, Sunghyun Yoon, Inho Noh, Jinhyung Kim, Khang June Lee, Hyesung Jung, Jongyoon Shin, Hyuk Hur, Kyoung Eun Chang, Incheol Cho, Kieyoung Woo, Byung Seok Moon, Jameyung Kim, Yeonsoo Ahn, Dahee Sim, Sungbong Park, Wook Lee, Kooktae Kim, Chong Kwang Chang, Hansik Yoon, Juha Kim, Sung-In Kim, Hyunchul Kim, Chang-Rok Moon, Jaihyuk Song

Proceedings of the IEEE International Solid-State Circuits Conference, 2024

A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND.

Ilho Myeong, Suhwan Lim, Taeyoung Kim, Sanghyun Park, Suseong Noh, Seung Min Lee, Jongho Woo, Hanseung Ko, Youngji Noh, Munkang Choi, Kiheun Lee, Sangwoo Han, Jongyeon Baek, Kijoon Kim, Dongjin Jung, Jisung Kim, Jaewoo Park, Seunghyun Kim, Hyoseok Kim, Ilyounz Yoon, Jaeho Kim, Kwangsoo Kim, Kwangmin Park, Bong Jin Kuh, Wanki Kim, Daewon Ha, Sujin Ahn, Jaihyuk Song, Sijung Yoo, Hyun Jae Lee, Duk-Hyun Choe, Seung-Geol Nam, Jinseong Heo

Proceedings of the IEEE International Reliability Physics Symposium, 2024

A Novel Quantitative Model for Combination Effects of Hydrogen and Process Heat on Peripheral Transistors in 3D-NAND Flash Memory.

Dongjin Lee, Yunjo Lee, Soyeong Na, KangOh Yun, Sungkweon Baek, Jaeduk Lee, Jaehoon Jang, Jaihyuk Song

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET.

Taeyoung Kim, Suhwan Lim, Ilho Myeong, Sanghyun Park, Suseong Noh, Seung Min Lee, Jongho Woo, Hanseung Ko, Youngji Noh, Moonkang Choi, Kiheun Lee, Sangwoo Han, Jongyeon Baek, Kijoon Kim, Dongjin Jung, Jisung Kim, Jaewoo Park, Seunghyun Kim, Hyoseok Kim, Sijung Yoo, Hyun Jae Lee, Duk-Hyun Choe, Seung-Geol Nam, Ilyoung Yoon, Chaeho Kim, Kwanzsoo Kim, Kwanzmin Park, Bong Jin Kuh, Jinseong Heo, Wanki Kim, Daewon Ha, Jaihyuk Song

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Trends and Future Challenges of 3D NAND Flash Memory.

Sun Il Shim, Jaehoon Jang, Jaihyuk Song

Proceedings of the IEEE International Memory Workshop, 2023

Improvement of GIDL-assisted Erase by using Surrounded BL PAD Structure for VNAND.

Suhwan Lim, Samki Kim, Changhee Lee, Hyeongwon Choi, Nambin Kim, Jaehun Jung, Hanvit Yang, Tae-Hun Kim, Junhee Lim, Daewon Ha, Sunghoi Hur, Jae-hoon Jang, Yu-Gyun Shin, Jaihyuk Song

Proceedings of the IEEE International Memory Workshop, 2023