Jaewoong Shim

According to our database, Jaewoong Shim authored at least 9 papers between 2017 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Generalized zero-shot learning for classifying unseen wafer map patterns.

Han Kyul Kim, Jaewoong Shim

Eng. Appl. Artif. Intell., 2024

Environmentally-Robust Defect Classification With Domain Augmentation Framework.

Sungho Lee, Jaewoong Shim

IEEE Access, 2024

2023

Learning from single-defect wafer maps to classify mixed-defect wafer maps.

Jaewoong Shim, Seokho Kang

Expert Syst. Appl., December, 2023

2022

Domain-adaptive active learning for cost-effective virtual metrology modeling.

Jaewoong Shim, Seokho Kang

Comput. Ind., 2022

2021

Active cluster annotation for wafer map pattern classification in semiconductor manufacturing.

Jaewoong Shim, Seokho Kang, Sungzoon Cho

Expert Syst. Appl., 2021

Adaptive fault detection framework for recipe transition in semiconductor manufacturing.

Jaewoong Shim, Sungzoon Cho, Euiseok Kum, Suho Jeong

Comput. Ind. Eng., 2021

2020

Kernel Rotation Forests for Classification.

Jaewoong Shim, Seokho Kang, Sungzoon Cho

Proceedings of the 2020 IEEE International Conference on Big Data and Smart Computing, 2020

2018

Product failure prediction with missing data.

Seokho Kang, Eunji Kim, Jaewoong Shim, Wonsang Chang, Sungzoon Cho

Int. J. Prod. Res., 2018

2017

Mining the relationship between production and customer service data for failure analysis of industrial products.

Seokho Kang, Eunji Kim, Jaewoong Shim, Sungzoon Cho, Wonsang Chang, Junhwan Kim

Comput. Ind. Eng., 2017