Jaemoo Choi

According to our database1, Jaemoo Choi authored at least 16 papers between 2021 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2024
Robust Barycenter Estimation using Semi-Unbalanced Neural Optimal Transport.
CoRR, 2024

Improving Neural Optimal Transport via Displacement Interpolation.
CoRR, 2024

Unsupervised Point Cloud Completion through Unbalanced Optimal Transport.
CoRR, 2024

Scalable Simulation-free Entropic Unbalanced Optimal Transport.
CoRR, 2024

Probe Card Ground Noise Canceling Circuit.
Proceedings of the IEEE International Test Conference, 2024

Scalable Wasserstein Gradient Flow for Generative Modeling through Unbalanced Optimal Transport.
Proceedings of the Forty-first International Conference on Machine Learning, 2024

Analyzing and Improving Optimal-Transport-based Adversarial Networks.
Proceedings of the Twelfth International Conference on Learning Representations, 2024

2023
Analyzing and Improving OT-based Adversarial Networks.
CoRR, 2023

Learning PDE Solution Operator for Continuous Modeling of Time-Series.
CoRR, 2023

Generative Modeling through the Semi-dual Formulation of Unbalanced Optimal Transport.
Proceedings of the Advances in Neural Information Processing Systems 36: Annual Conference on Neural Information Processing Systems 2023, 2023

Method for Diagnosing Channel Damage Using FPGA Transceiver.
Proceedings of the IEEE International Test Conference, 2023

Method for Adjusting Termination Resistance Using PMU in DC Test.
Proceedings of the IEEE International Test Conference, 2023

Restoration based Generative Models.
Proceedings of the International Conference on Machine Learning, 2023

2022
4.5 Gsps MIPI D-PHY Receiver Circuit for Automatic Test Equipment.
Proceedings of the IEEE International Test Conference, 2022

2021
Robust Out-of-Distribution Detection on Deep Probabilistic Generative Models.
CoRR, 2021

3.5Gsps MIPI C-PHY Receiver Circuit for Automatic Test Equipment.
Proceedings of the IEEE International Test Conference, 2021


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