Jaehwan Shin

According to our database, Jaehwan Shin authored at least 2 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2024

Production-Oriented Design for High Parallel Test Efficiency.

Jaehwan Shin, Young-Woo Lee

Proceedings of the 21st International SoC Design Conference, 2024

2023

Instruction-based March Test Pattern Generation Scheme for At-Speed Test Cost Reduction.

Seokmin Park, Gayeong Lee, Jaehwan Shin, Seunghan Lee, Young-Woo Lee

Proceedings of the International Conference on Artificial Intelligence in Information and Communication, 2023