Jae Woong Jeong

According to our database, Jae Woong Jeong authored at least 15 papers between 2013 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration.

Jae Woong Jeong, Jennifer Kitchen, Sule Ozev

IEEE Des. Test, 2019

2017

A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources.

Jae Woong Jeong, Vishwanath Natarajan, Shreyas Sen, T. M. Mak, Jennifer Kitchen, Sule Ozev

ACM Trans. Design Autom. Electr. Syst., 2017

A Study of AI Based E-learning System and Application.

Min-Gyu Shim, Jae Woong Jeong

Proceedings of the Advanced Multimedia and Ubiquitous Engineering, 2017

A Study on the Serious Issues in the Practice of Information Security in IT: With a Focus on Ransomware.

Junhak Lee, Jae Woong Jeong

Proceedings of the Advanced Multimedia and Ubiquitous Engineering, 2017

Advanced Data Communication Framework for Cloud Computing from CDMI.

Jae-Yun Jeong, Jae Woong Jeong

Proceedings of the Advanced Multimedia and Ubiquitous Engineering, 2017

Built-in self-test for stability measurement of low dropout regulator.

Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev

Proceedings of the IEEE International Test Conference, 2017

Evaluation of loop transfer function based dynamic testing of LDOs.

Mehmet Ince, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, Sule Ozev

Proceedings of the International Test Conference in Asia, 2017

2016

Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers.

Jae Woong Jeong, Afsaneh Nassery, Jennifer N. Kitchen, Sule Ozev

IEEE Trans. Very Large Scale Integr. Syst., 2016

Process independent gain measurement with low overhead via BIST/DUT co-design.

Jae Woong Jeong, Jennifer Kitchen, Sule Ozev

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015

A self-compensating built-in self-test solution for RF phased array mismatch.

Jae Woong Jeong, Jennifer Kitchen, Sule Ozev

Proceedings of the 2015 IEEE International Test Conference, 2015

Robust amplitude measurement for RF BIST applications.

Jae Woong Jeong, Jennifer Kitchen, Sule Ozev

Proceedings of the 20th IEEE European Test Symposium, 2015

2014

Development and empirical verification of an accuracy model for the power down leakage tests.

Jae Woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Built-in self-test and characterization of polar transmitter parameters in the loop-back mode.

Jae Woong Jeong, Sule Ozev, Shreyas Sen, Vishwanath Natarajan, Mustapha Slamani

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters.

Jae Woong Jeong, Sule Ozev, Shreyas Sen, T. M. Mak

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Zero-overhead self test and calibration of RF transceivers.

Afsaneh Nassery, Jae Woong Jeong, Sule Ozev

Proceedings of the 2013 IEEE International Test Conference, 2013