Jae-Seong Jeong

According to our database, Jae-Seong Jeong authored at least 14 papers between 2004 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Lifetime and failure analysis of perovskite-based ceramic NTC thermistors by thermal cycling and abrasion combined stress.

Jae-Seong Jeong, Won-kyoung Lee, Chung-kuk Lee, Joongho Choi

Microelectron. Reliab., 2017

2016

Effect of H/Ar treatment on ZnO: B transparent conducting oxide for flexible a-Si: H/μc-Si: H photovoltaic modules under damp heat stress.

Jae-Seong Jeong, Yong-Hyun Kim, Chang-kyun Park, Heon-Do Kim, Joongho Choi

Microelectron. Reliab., 2016

2015

The degradation mechanism of flexible a-Si: H/μc-Si: H photovoltaic modules.

Jae-Seong Jeong, Yong-Hyun Kim, Chang-kyun Park, Heon-Do Kim, Joongho Choi

Microelectron. Reliab., 2015

2014

Estimation of the degradation rate of multi-crystalline silicon photovoltaic module under thermal cycling stress.

Nochang Park, Jae-Seong Jeong, Changwoon Han

Microelectron. Reliab., 2014

2013

Field failure mechanism and reproduction due to moisture for low-voltage ZnO varistors.

Jae-Seong Jeong

Microelectron. Reliab., 2013

2012

Field failure mechanism study of solder interconnection for crystalline silicon photovoltaic module.

Jae-Seong Jeong, Nochang Park, Changwoon Han

Microelectron. Reliab., 2012

Failure mechanism and reliability test method for USB interface circuitry on CPUs for mobile devices.

Jae-Seong Jeong

Microelectron. Reliab., 2012

2010

Failure mechanism of COF based Line Driver IC for Flat Panel Display by contamination.

Jae-Seong Jeong, Young Jeon Kim

Microelectron. Reliab., 2010

An Efficient Method for Game Development using Compiler.

Jae-Seong Jeong, Soon Ghon Kim

Proceedings of the ICEIS 2010 - Proceedings of the 12th International Conference on Enterprise Information Systems, Volume 3, ISAS, Funchal, Madeira, Portugal, June 8, 2010

2009

Failure analysis of video processor defined as No Fault Found (NFF): Reproduction in system level and advanced analysis technique in IC level.

Jae-Seong Jeong, Sang-Deuk Park

Microelectron. Reliab., 2009

2008

Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED.

Jae-Seong Jeong, Jin-Kyu Jung, Sang-Deuk Park

Microelectron. Reliab., 2008

2007

Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules.

Jae-Seong Jeong, Soon-Ha Hong, Sang-Deuk Park

Microelectron. Reliab., 2007

2005

Stress Mechanism about Field Lightning Surge of High Voltage BJT Based Line Driver for ADSL System.

Jae-Seong Jeong, Jae-Hyun Lee, Jong-Shin Ha, Sang-Deuk Park

Microelectron. Reliab., 2005

2004

Field Failure Mechanism Investigation of GaAs based HBT Power Amplifier Mmodule (PAM).

Jae-Seong Jeong, Jong-Shin Ha, Sang-Deuk Park

Microelectron. Reliab., 2004