Jae Hyun Kwon

According to our database, Jae Hyun Kwon authored at least 6 papers between 2018 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuromorphic Computation.

J. Tan, J. H. Lim, Jae Hyun Kwon, Vinayak Bharat Naik, Nagarajan Raghavan, Kin Leong Pey

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2020

Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM.

Jia Hao Lim, Nagarajan Raghavan, Jae Hyun Kwon, Tae Young Lee, Robin Chao, Nyuk Leong Chung, Kazutaka Yamane, Naganivetha Thiyagarajah, Vinayak Bharat Naik, Kin Leong Pey

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production.

Tae Young Lee, Kazutaka Yamane, Lee Yong Hau, Robin Chao, Nyuk Leong Chung, Vinayak Bharat Naik, K. Sivabalan, Jae Hyun Kwon, Jia Hao Lim, Wah-Peng Neo, Kevin Khua, Naganivetha Thiyagarajah, Suk Hee Jang, Behtash Behin-Aein, Eng-Huat Toh, Yuichi Otani, Dinggui Zeng, Nivetha Balasankaran, Lian Choo Goh, Timothy Ling, Jay Hwang, Lei Zhang, Rachel Low, Soon Leng Tan, Chim Seng Seet, Jia Wen Ting, Stanley Ong, Young Seon You, Swee Tuck Woo, Elgin Quek, Soh Yun Siah

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Superior Endurance Performance of 22-nm Embedded MRAM Technology.

Vinayak Bharat Naik, J. H. Lim, K. Yamane, Dinggui Zeng, H. Yang, N. Thiyagarajah, Jae Hyun Kwon, N. L. Chung, R. Chao, T. Ling, K. Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Correct Extrapolation Model for TDDB of STT-MRAM MgO Magnetic Tunnel Junctions.

Jia Hao Lim, Nagarajan Raghavan, Vinayak Bharat Naik, Jae Hyun Kwon, Kazutaka Yamane, H. Yang, K. H. Lee, Kin Leong Pey

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Area and pulsewidth dependence of bipolar TDDB in MgO magnetic tunnel junction.

Jia Hao Lim, Nagarajan Raghavan, Sen Mei, Vinayak Bharat Naik, Jae Hyun Kwon, S. M. Noh, B. Liu, E. H. Toh, Nyuk Leong Chung, Robin Chao, K. H. Lee, Kin Leong Pey

Proceedings of the IEEE International Reliability Physics Symposium, 2018