Jacques Pinaton
According to our database1,
Jacques Pinaton
authored at least 50 papers
between 2010 and 2022.
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Bibliography
2022
LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes.
Proceedings of the European Control Conference, 2022
2021
Combining Approaches of Brownian Motion and Similarity Principle to Improve the Remaining Useful Life Prediction.
Proceedings of the International IEEE Conference on Prognostics and Health Management, 2021
Proceedings of the International Conference on Control, Automation and Diagnosis, 2021
From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry.
Proceedings of the 2021 European Control Conference, 2021
Data-Based Approach for Final Product Quality Inspection: Application to a Semiconductor Industry.
Proceedings of the 2021 60th IEEE Conference on Decision and Control (CDC), 2021
2020
IEEE Trans Autom. Sci. Eng., 2020
Expert Syst. Appl., 2020
2019
Limiting state space explosion of model checking using discrete event simulation: combining DEVS and PROMELA.
Proceedings of the 2019 Summer Simulation Conference, 2019
Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network<sup>*</sup>.
Proceedings of the 8th International Conference on Systems and Control, 2019
Evaluation of Alarm System Performance and Management in Semiconductor Manufacturing.
Proceedings of the 6th International Conference on Control, 2019
Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing.
Proceedings of the 58th IEEE Conference on Decision and Control, 2019
Monitoring of a sampled process data under Run-to-Run control: application to a semiconductor process.
Proceedings of the 15th IEEE International Conference on Automation Science and Engineering, 2019
2018
Proceedings of the 2018 Winter Simulation Conference, 2018
Proceedings of the 2018 Winter Simulation Conference, 2018
Proceedings of the 2018 Winter Simulation Conference, 2018
Improving Business Process in semiconductor manufacturing by Discovering Business Rules.
Proceedings of the 2018 Winter Simulation Conference, 2018
A Bayesian indicator for Run-to-Run performance assessment in semiconductor manufacturing.
Proceedings of the 14th Conference on Ph.D. Research in Microelectronics and Electronics, 2018
2017
Translation-Invariant Multiscale Energy-Based PCA for Monitoring Batch Processes in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng., 2017
A Simulation-Based Approach for an Effective AMHS Design in a Legacy Semiconductor Manufacturing Facility.
Proceedings of the 2017 Winter Simulation Conference, 2017
Product quality prediction using alarm data : Application to the semiconductor manufacturing process.
Proceedings of the 25th Mediterranean Conference on Control and Automation, 2017
Analysis of similarities between alarm events in the semiconductor manufacturing process.
Proceedings of the 25th Mediterranean Conference on Control and Automation, 2017
2016
Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing.
Proceedings of the Winter Simulation Conference, 2016
Self-tuning of dEWMA controller parameters for mixed product processes with equipment aging.
Proceedings of the 24th Mediterranean Conference on Control and Automation, 2016
Regularized regression models to predict the product quality in multistep manufacturing.
Proceedings of the 5th International Conference on Systems and Control, 2016
Virtual metrology on Chemical Mechanical Planarization process based on Just-In-Time Learning.
Proceedings of the 5th International Conference on Systems and Control, 2016
Online optimized parameters for RLS-LT controller - application to processes with mixed products and feature aging.
Proceedings of the 5th International Conference on Systems and Control, 2016
Proceedings of the 5th International Conference on Systems and Control, 2016
Proceedings of the 2016 American Control Conference, 2016
2015
Comput. Oper. Res., 2015
Simulation model to control risk levels on process equipment through metrology in semiconductor manufacturing.
Proceedings of the 2015 Winter Simulation Conference, 2015
Proceedings of the 4th International Conference on Systems and Control, 2015
Proceedings of the 2015 IEEE Conference on Prognostics and Health Management, 2015
2014
Similar sample selection approach based on sequence alignment; application to semiconductor industry.
Proceedings of the 22nd Mediterranean Conference on Control and Automation, 2014
A Pattern-based Approach for Semantic Retrieval of Information Resources in Enterprises - Application Within STMicroelectronics.
Proceedings of the ICEIS 2014, 2014
Proceedings of the 2014 IEEE International Conference on Automation Science and Engineering, 2014
2013
Skipping algorithms for defect inspection using a dynamic control strategy in semiconductor manufacturing.
Proceedings of the Winter Simulations Conference: Simulation Making Decisions in a Complex World, 2013
A Semantic Mapping Approach to Retrieve Manufacturing Information Resources: STMicroelectronics' Case Study.
Proceedings of the 7th IFAC Conference on Manufacturing Modelling, Management, and Control, 2013
Application of Principal Components Analysis to improve fault detection and diagnosis on semiconductor manufacturing equipment.
Proceedings of the 12th European Control Conference, 2013
A semantic support to improve the collaborative control of manufacturing processes in industries.
Proceedings of the 2013 IEEE 17th International Conference on Computer Supported Cooperative Work in Design (CSCWD), 2013
2012
A mathematical model for estimating defect inspection capacity with a dynamic control strategy.
Proceedings of the Winter Simulation Conference, 2012
Validating manufacturing processes using timed sequential machines: application to a semiconductor manufacturing process (WIP).
Proceedings of the 2012 Spring Simulation Multiconference, 2012
A survey of semantic web standards to representing knowledge in problem solving situations.
Proceedings of the 2012 International Conference on Information Retrieval & Knowledge Management, 2012
A Topic-Map-based Framework to Enhance Components' Retrieval in a Process Control.
Proceedings of the ICEIS 2012 - Proceedings of the 14th International Conference on Enterprise Information Systems, Volume 2, Wroclaw, Poland, 28 June, 2012
Dispatching of lots to dynamically reduce the wafers at risk in semiconductor manufacturing.
Proceedings of the 2012 IEEE International Conference on Automation Science and Engineering, 2012
2011
A smart sampling scheduling and skipping simulator and its evaluation on real data sets.
Proceedings of the Winter Simulation Conference 2011, 2011
Impact of control plan design on tool risk management: a simulation study in semiconductor manufacturing.
Proceedings of the Winter Simulation Conference 2011, 2011
Constructing DEVS models based on experts' knowledge: application to STMicroelectronics' large scale manufacturing processes.
Proceedings of the 2011 Spring Simulation Multi-conference, 2011
New methodology for modeling large scale manufacturing process: Using process mining methods and experts' knowledge.
Proceedings of the 9th IEEE/ACS International Conference on Computer Systems and Applications, 2011
2010
Discovering Large Scale Manufacturing Process Models from Timed Data - Application to STMicroelectronics' Production Processes.
Proceedings of the ICSOFT 2010, 2010
Modeling Large Scale Manufacturing Process from Timed Data - Using the TOM4L Approach and Sequence Alignment Information for Modeling STMicroelectronics' Production Processes.
Proceedings of the ICEIS 2010 - Proceedings of the 12th International Conference on Enterprise Information Systems, Volume 2, AIDSS, Funchal, Madeira, Portugal, June 8, 2010