Jack Strand
Orcid: 0000-0002-4603-6151
According to our database1,
Jack Strand
authored at least 4 papers
between 2018 and 2023.
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Bibliography
2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Variability and disturb sources in ferroelectric 3D NANDs and comparison to Charge-Trap equivalents.
Proceedings of the IEEE International Memory Workshop, 2022
2021
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2018
Role of electron and hole trapping in the degradation and breakdown of SiO2 and HfO2 films.
Proceedings of the IEEE International Reliability Physics Symposium, 2018