Jaap Bisschop

According to our database, Jaap Bisschop authored at least 5 papers between 2002 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Determination of the stress level for voltage screen of integrated circuits.

Ramun M. Kho, A. J. Moonen, V. M. Girault, Jaap Bisschop, E. H. T. Olthof, S. Nath, Z. N. Liang

Microelectron. Reliab., 2010

2008

Editorial.

Guido Groeseneken, Ingrid De Wolf, A. J. Mouthaan, Jaap Bisschop

Microelectron. Reliab., 2008

2007

Reliability methods and standards.

Jaap Bisschop

Microelectron. Reliab., 2007

2004

Integrated thermo-mechanical design and qualification of wafer backend structures.

G. Q. Zhang, Jaap Bisschop

Microelectron. Reliab., 2004

2002

Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling.

H. V. Nguyen, Cora Salm, J. Vroemen, J. Voets, Benno Krabbenborg, Jaap Bisschop, A. J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2002