J.-Y. Tewg

According to our database, J.-Y. Tewg authored at least 1 paper in 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2006

Electrical reliability aspects of HfO₂ high-k gate dielectrics with TaN metal gate electrodes under constant voltage stress.

S. Chatterjee, Yue Kuo, J. Lu, J.-Y. Tewg, P. Majhi

Microelectron. Reliab., 2006