J. Shuster-Passage

According to our database, J. Shuster-Passage authored at least 2 papers in 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

A Unified Physics-Based Stochastic Model for EM-Induced Resistance Degradation in BEoL Interconnect Segments.

Valeriy Sukharev, Jun-Ho Choy, Armen Kteyan, J. Shuster-Passage, Seungman Choi, Martin Gall

Proceedings of the IEEE International Reliability Physics Symposium, 2024

A Novel Method for the Determination of Electromigration-Induced Void Nucleation Stresses.

J. Shuster-Passage, S. Abdel Razek, M. Mattoo, Meike Hauschildt, Seungman Choi, Martin Gall, Armen Kteyan, Jun-Ho Choy, Valeriy Sukharev, Matthias Kraatz, J. R. Lloyd

Proceedings of the IEEE International Reliability Physics Symposium, 2024