J. Lefevre

According to our database, J. Lefevre authored at least 3 papers between 2021 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Predictor BIST: An "All-in-One" Optical Test Solution for CMOS Image Sensors.

J. Lefevre, P. Debaud, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE International Test Conference, 2023

2022

A Generic Fast and Low Cost BIST Solution for CMOS Image Sensors.

J. Lefevre, P. Debaud, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE European Test Symposium, 2022

2021

A Fast and Low Cost Embedded Test Solution for CMOS Image Sensors.

J. Lefevre, Philippe Debaud, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE International Test Conference, 2021