J. Laurent
According to our database1,
J. Laurent
authored at least 3 papers
between 1983 and 1991.
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Bibliography
1991
Proceedings of the Proceedings IEEE International Test Conference 1991, 1991
1986
Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing.
Proceedings of the Proceedings International Test Conference 1986, 1986
1983
A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processing.
Pattern Recognit. Lett., 1983