J. L. Rainard

According to our database, J. L. Rainard authored at least 3 papers between 1987 and 1994.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

1994

Hierarchical Test Analysis of VLSI Circuits for Random BIST.

G. Masseboeuf, J. Pulou, J. L. Rainard

Proceedings of the Dependable Computing, 1994

1990

Some relationships between delay testing and stuck-open testing in CMOS circuits.

Rene David, S. Rahal, J. L. Rainard

Proceedings of the European Design Automation Conference, 1990

1987

Fault Detection By Consumption Measurement in CMOS Circuits.

Mireille Jacomino, J. L. Rainard, René David

Proceedings of the Fehlertolerierende Rechensysteme / Fault-Tolerant Computing Systems, 1987