Izumi Hirano
According to our database1,
Izumi Hirano
authored at least 3 papers
between 2000 and 2013.
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Bibliography
2013
Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing.
Microelectron. Reliab., 2013
2001
Proceedings of the EUROSPEECH 2001 Scandinavia, 2001
2000
Proceedings of the Sixth International Conference on Spoken Language Processing, 2000