Ivo Vogt
According to our database1,
Ivo Vogt
authored at least 3 papers
between 2017 and 2018.
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Bibliography
2018
Detection of failure mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera.
Microelectron. Reliab., 2018
Device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra.
Microelectron. Reliab., 2018
2017