Ivo Schanstra

According to our database, Ivo Schanstra authored at least 10 papers between 1994 and 2004.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2004

Influence of Bit Line Twisting on the Faulty Behavior of DRAMs.

Zaid Al-Ars, Martin Herzog, Ivo Schanstra, Ad J. van de Goor

Proceedings of the 12th IEEE International Workshop on Memory Technology, 2004

2003

Consequences of RAM Bitline Twisting for Test Coverage.

Ivo Schanstra, Ad J. van de Goor

Proceedings of the 2003 Design, 2003

2002

Address and Data Scrambling: Causes and Impact on Memory Tests.

Ad J. van de Goor, Ivo Schanstra

Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

1999

Industrial evaluation of stress combinations for march tests applied to SRAMs.

Ad J. van de Goor, Ivo Schanstra

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Semiconductor manufacturing process monitoring using built-in self-test for embedded memories.

Ivo Schanstra, Dharmajaya Lukita, Ad J. van de Goor, Kees Veelenturf, Paul J. van Wijnen

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1996

Towards a Uniform Notation for Memory Tests.

Ad J. van de Goor, Aad Offerman, Ivo Schanstra

Proceedings of the 1996 European Design and Test Conference, 1996

1995

Functional test for shifting-type FIFOs.

Ad J. van de Goor, Ivo Schanstra, Yervant Zorian

Proceedings of the 1995 European Design and Test Conference, 1995

1994

Fault models and tests for Ring Address Type FIFOs.

Ad J. van de Goor, Ivo Schanstra, Yervant Zorian

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

An Effective BIST Scheme for Ring-Address Type FIFOs.

Yervant Zorian, Ad J. van de Goor, Ivo Schanstra

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

Functional Tests for Ring-Address SRAM-type FIFOs.

Ad J. van de Goor, Yervant Zorian, Ivo Schanstra

Proceedings of the EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28, 1994