Ivo S. M. de Jong

According to our database, Ivo S. M. de Jong authored at least 5 papers between 2008 and 2009.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2009

Process Mining Applied to the Test Process of Wafer Scanners in ASML.

Anne Rozinat, Ivo S. M. de Jong, Christian W. Günther, Wil M. P. van der Aalst

IEEE Trans. Syst. Man Cybern. Part C, 2009

Hierarchical Test Sequencing for Complex Systems.

R. Boumen, Sui Ruan, Ivo S. M. de Jong, Joanna M. van de Mortel-Fronczak, Jacobus E. Rooda, Krishna R. Pattipati

IEEE Trans. Syst. Man Cybern. Part A, 2009

Integration and Test Sequencing for Complex Systems.

R. Boumen, Ivo S. M. de Jong, J. M. G. Mestrom, Joanna M. van de Mortel-Fronczak, Jacobus E. Rooda

IEEE Trans. Syst. Man Cybern. Part A, 2009

2008

Risk-Based Stopping Criteria for Test Sequencing.

R. Boumen, Ivo S. M. de Jong, J. W. H. Vermunt, Joanna M. van de Mortel-Fronczak, Jacobus E. Rooda

IEEE Trans. Syst. Man Cybern. Part A, 2008

Test Sequencing in Complex Manufacturing Systems.

R. Boumen, Ivo S. M. de Jong, J. W. H. Vermunt, Joanna M. van de Mortel-Fronczak, Jacobus E. Rooda

IEEE Trans. Syst. Man Cybern. Part A, 2008