Ishwar Parulkar

According to our database1, Ishwar Parulkar authored at least 20 papers between 1994 and 2010.

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Bibliography

2010
Panel: Reliability of data centers: Hardware vs. software.
Proceedings of the Design, Automation and Test in Europe, 2010

2009
Architecture and Physical Implementation of a Third Generation 65 nm, 16 Core, 32 Thread Chip-Multithreading SPARC Processor.
IEEE J. Solid State Circuits, 2009

Comprehensive Approach to High-Performance Server Chipset Debug.
IEEE Des. Test Comput., 2009

Exploiting Thread-Level Parallelism in Functional Self-Testing of CMT Processors.
Proceedings of the 14th IEEE European Test Symposium, 2009

2008
DFX of a 3<sup>rd</sup> Generation, 16-core/32-thread UltraSPARC- CMT Microprocessor.
Proceedings of the 2008 IEEE International Test Conference, 2008

Implementation of a Third-Generation 16-Core 32-Thread Chip-Multithreading SPARCs® Processor.
Proceedings of the 2008 IEEE International Solid-State Circuits Conference, 2008

Silent Data Corruption - Myth or reality?
Proceedings of the 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, 2008

2005
Testing high-speed, large scale implementation of SerDes I/Os on chips used in throughput computing systems.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Testing throughput computing interconnect topologies with Tbits/sec bandwidth in manufacturing and in field.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Trends and Trade-Offs in Designing Highly Robust Throughput Computing Oriented Chips and Systems.
Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2003
Latch Divergency In Microprocessor Failure Analysis.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002
A Scalable, Low Cost Design-for-Test Architecture for UltraSPARC<sup>TM</sup> Chip Multi-Processors.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001
Introducing redundant computations in RTL data paths for reducing BIST resources.
ACM Trans. Design Autom. Electr. Syst., 2001

1998
Estimation of BIST Resources During High-Level Synthesis.
J. Electron. Test., 1998

Allocation Techniques for Reducing BIST Area Overhead of Data Paths.
J. Electron. Test., 1998

Scheduling and Module Assignment for Reducing Bist Resources.
Proceedings of the 1998 Design, 1998

Introducing Redundant Computations in a Behavior for Reducing BIST Resources.
Proceedings of the 35th Conference on Design Automation, 1998

1996
Lower Bounds on Test Resources for Scheduled Data Flow Graphs.
Proceedings of the 33st Conference on Design Automation, 1996

1995
Data Path Allocation for Synthesizing RTL Designs with Low BIST Area Overhead.
Proceedings of the 32st Conference on Design Automation, 1995

1994
Extraction of a High-level structural Representation from Circuit Descriptions with Applications to DFT/BIST.
Proceedings of the 31st Conference on Design Automation, 1994


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