Ira Leventhal

According to our database, Ira Leventhal authored at least 6 papers between 2019 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Innovative Practices Track: Session 6 - Using AI to Address the Silicon Growth Curve.

Duane Brown, Ira Leventhal, Sri Ganta, Keith Schaub

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

2022

Improvements in Automated IC Socket Pin Defect Detection.

Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao

Proceedings of the IEEE International Test Conference, 2022

2020

Automated Socket Anomaly Detection through Deep Learning.

Nidhi Agrawal, Min-Jian Yang, Constantinos Xanthopoulos, Vijayakumar Thangamariappan, Joe Xiao, Chee-Wah Ho, Keith Schaub, Ira Leventhal

Proceedings of the IEEE International Test Conference, 2020

2019

IP Session on Machine Learning Applications in IC Test-Related Tasks.

Ghada Sokar, Yassin Zakaria, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Machine Learning-based Noise Classification and Decomposition in RF Transceivers.

Deepika Neethirajan, Constantinos Xanthopoulos, Kiruba S. Subramani, Keith Schaub, Ira Leventhal, Yiorgos Makris

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion.

Kosuke Ikeda, Keith Schaub, Ira Leventhal, Yiorgos Makris, Constantinos Xanthopoulos, Deepika Neethirajan

Proceedings of the IEEE International Test Conference, 2019