Innocent Agbo

According to our database, Innocent Agbo authored at least 19 papers between 2013 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2020

Big Data Architecture: Designing the Right Solution for Social Network Analysis.

Innocent Agbo, Alexander V. Kupriyanov, Igor Rytsarev

Proceedings of the 8th International Symposium on Digital Forensics and Security, 2020

2019

Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM.

Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2019

Software-Based Mitigation for Memory Address Decoder Aging.

Daniel H. P. Kraak, Cemil Cem Gürsoy, Innocent O. Agbo, Mottaqiallah Taouil, Maksim Jenihhin, Jaan Raik, Said Hamdioui

Proceedings of the IEEE Latin American Test Symposium, 2019

Reliability Modeling and Mitigation for Embedded Memories.

Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2019

Hardware-Based Aging Mitigation Scheme for Memory Address Decoder.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 24th IEEE European Test Symposium, 2019

Methodology for Application-Dependent Degradation Analysis of Memory Timing.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2018

Impact and mitigation of SRAM read path aging.

Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene

Microelectron. Reliab., 2018

Degradation analysis of high performance 14nm FinFET SRAM.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2017

Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads.

Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2017

Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier.

Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2017

Mitigation of sense amplifier degradation using input switching.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2016

Read path degradation analysis in SRAM.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene

Proceedings of the 21th IEEE European Test Symposium, 2016

Comparative BTI analysis for various sense amplifier designs.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor

Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

2015

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

BTI analysis of SRAM write driver.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Proceedings of the 10th International Design & Test Symposium, 2015

Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier.

Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Stefan Cosemans, Pieter Weckx, Praveen Raghavan, Francky Catthoor

Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015

2014

Bias Temperature Instability analysis of FinFET based SRAM cells.

Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

BTI impact on SRAM sense amplifier.

Innocent Agbo, Seyab Khan, Said Hamdioui

Proceedings of the 8th International Design and Test Symposium, 2013