Indradeep Ghosh
Orcid: 0000-0003-3146-4003
According to our database1,
Indradeep Ghosh
authored at least 50 papers
between 1994 and 2022.
Collaborative distances:
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Bibliography
2022
Proceedings of the 7th IEEE/ACM Symposium on Edge Computing, 2022
Proceedings of the IEEE International Conference on Data Mining Workshops, 2022
Proceedings of the Computational Science - ICCS 2022, 2022
2021
Proceedings of the Advances in Intelligent Data Analysis XIX, 2021
2020
2017
IEEE Softw., 2017
2016
Proceedings of the 24th ACM SIGSOFT International Symposium on Foundations of Software Engineering, 2016
Proceedings of the 25th International Symposium on Software Testing and Analysis, 2016
2015
Proceedings of the 8th IEEE International Conference on Software Testing, 2015
2014
Proceedings of the 22nd ACM SIGSOFT International Symposium on Foundations of Software Engineering, (FSE-22), Hong Kong, China, November 16, 2014
2013
JST: an automatic test generation tool for industrial Java applications with strings.
Proceedings of the 35th International Conference on Software Engineering, 2013
Proceedings of the Hardware and Software: Verification and Testing, 2013
Proceedings of the Hardware and Software: Verification and Testing, 2013
2012
Proceedings of the 17th ACM SIGPLAN Symposium on Principles and Practice of Parallel Programming, 2012
2011
Proceedings of the Computer Aided Verification - 23rd International Conference, 2011
2009
Proceedings of the 31st International Conference on Software Engineering, 2009
2008
Proceedings of the Programming Languages and Systems, 6th Asian Symposium, 2008
The Morgan Kaufmann series in systems on silicon, Morgan Kaufmann, ISBN: 978-0-12-370616-4, 2008
2006
A Framework for Automatic Design Validation of RTL Circuits Using ATPG and Observability-Enhanced Tag Coverage.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006
Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006
2005
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005
2004
Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004
2003
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
Proceedings of the 21st International Conference on Computer Design (ICCD 2003), 2003
On automatic generation of RTL validation test benches using circuit testing techniques.
Proceedings of the 13th ACM Great Lakes Symposium on VLSI 2003, 2003
Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003
Event-driven observability enhanced coverage analysis of C programs for functional validation.
Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003
2002
Proceedings of the 7th Asia and South Pacific Design Automation Conference (ASP-DAC 2002), 2002
2001
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2001
Automatic test pattern generation for functional register-transferlevel circuits using assignment decision diagrams.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2001
Proceedings of the Sixth IEEE International High-Level Design Validation and Test Workshop 2001, 2001
2000
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000
Proceedings of the 13th International Conference on VLSI Design (VLSI Design 2000), 2000
Proceedings of the IEEE International Conference On Computer Design: VLSI In Computers & Processors, 2000
Automatic test pattern generation for functional RTL circuits using assignment decision diagrams.
Proceedings of the 37th Conference on Design Automation, 2000
1999
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999
A low overhead design for testability and test generation technique for core-based systems-on-a-chip.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999
1998
A design-for-testability technique for register-transfer level circuits using control/data flow extraction.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998
Controller Resynthesis for Testability Enhancement of RTL Controller/Data Path Circuits.
J. Electron. Test., 1998
Proceedings of the 35th Conference on Design Automation, 1998
Proceedings of the 35th Conference on Design Automation, 1998
1997
Design for hierarchical testability of RTL circuits obtained by behavioral synthesis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997
Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997
Proceedings of the 34st Conference on Design Automation, 1997
1996
A design for testability technique for RTL circuits using control/data flow extraction.
Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, 1996
1995
VLSI Implementation of An Efficient ASIC Architecture for Real-Time Rotation of Digital Images.
Int. J. Pattern Recognit. Artif. Intell., 1995
1994
Proceedings of the Seventh International Conference on VLSI Design, 1994