Ilan Tsameret

According to our database, Ilan Tsameret authored at least 5 papers between 2015 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2021

Customized Parallel Reliability Testing Platform with Multifold Throughput Enhancement for Intel Stressing Tests.

Peng Xiao, Haris Hadziosmanovic, Michael Klessens, Rong Jiang, John Ortega, Daniel Schroeder, James Palmer, Ilan Tsameret

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Machine Learning On Transistor Aging Data: Test Time Reduction and Modeling for Novel Devices.

Neel Chatterjee, John Ortega, Inanc Meric, Peng Xiao, Ilan Tsameret

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Reliability Stressing Control Using Jacobian Feedback Kelvin Measurement on Intel Technologies.

Peng Xiao, Haris Hadziosmanovic, Rong Jiang, Misagh Rostami-asrabad, Stephen Ramey, Ilan Tsamaret

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Reliability of dual-damascene local interconnects featuring cobalt on 10 nm logic technology.

F. Griggio, James Palmer, F. Pan, N. Toledo, Anthony Schmitz, Ilan Tsameret, R. Kasim, Gerald S. Leatherman, Jeffery Hicks, A. Madhavan, J. Shin, J. Steigerwald, A. Yeoh, C. Auth

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015

Wafer-level electromigration for reliability monitoring: Quick-turn electromigration stress with correlation to package-level stress.

D. Slottke, R. J. Kamaladasa, M. Harmes, Ilan Tsameret, Mauro J. Kobrinsky, Timothy McMullen, John Dunklee

Proceedings of the IEEE International Reliability Physics Symposium, 2015