Il-soo Lee

According to our database, Il-soo Lee authored at least 5 papers between 2004 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2006

An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint.

Geewhun Seok, Il-soo Lee, Tony Ambler, Baxter F. Womack

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

2005

Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set.

Il-soo Lee, Yu-Ting Lin, Anthony P. Ambler

Proceedings of the 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), 2005

Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume.

Il-soo Lee, Jae-Hoon Jeong, Anthony P. Ambler

Proceedings of the 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), 2005

Two efficient methods to reduce power and testing time.

Il-soo Lee, Tony Ambler

Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005

2004

The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time.

Il-soo Lee, Yong Min Hur, Tony Ambler

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004